- The key vendors in the Global Thin Film Metrology Systems Market 2015-2019 are KLA-Tencor Corp., Nanometrics Inc., Nova Measuring Instruments Ltd. and Rudolph Technologies Inc.
London, 20 January 2015: TechNavio, an independent tech-focused global research firm, has announced the publication of its market research report on the Global Thin Film Metrology Systems Market 2015-2019. One of the major trends in the market is the increase in demand for integration and miniaturization of semiconductor devices. High level of integration to add functionalities on a single device is leading to the miniaturization of ICs which is accelerating the demand for thin film metrology systems to effectively enable a semiconductor manufacturing process. The Global Thin Film Metrology Systems market is expected to grow at a CAGR of 3.4 percent during the period 2014-2019.
Thin film metrology systems are used to measure film thickness during the thin film deposition process. They enable semiconductor manufacturers to accurately monitor and measure the number of layers that need to be aligned during thin film deposition and other parameters such as resistivity, thickness, and stress.
“The increase in demand for advanced electronic gadgets that support a diverse range of applications is adding pressure on semiconductor manufacturers for inventing technologically advanced nodes,” says Faisal Ghaus, Vice President of TechNavio Research.
“Semiconductor manufacturers are focusing on innovations to sustain competition, reduce manufacturing cost, and improve product efficiency.”
To define the market conditions in the next 3-4 years, TechNavio analysts have conducted in-depth analysis of the impact of market drivers, challenges and trends featuring data on product segmentations, vendor shares, growth rate by revenue and an evaluation of the different buying criteria in the order of importance.
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